diffractometer造句

1、The products were well-characterized by X-ray diffractometer and scanning electron microscope.
所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。

2、The Principle of X-ray diffractometer method of macrostress measurement is described in this Paper.
本文叙述了使用X射线衍射仪法测量宏观应力的原理。

3、It was characterized by optical microscope, SEM, IR, DSC and X-rays diffractometer respectively.
采用光学显微镜、SEM、IR、DSC和X射线衍射等多种手段对其进行表征。